"Shelf Life Prediction by Intelligent RFID - Technical Limits of Model ..."

Reiner Jedermann, Jean-Pierre Emond, Walter Lang (2007)

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DOI: 10.1007/978-3-540-76862-3_22

access: closed

type: Conference or Workshop Paper

metadata version: 2018-12-13

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Reiner Jedermann, Jean-Pierre Emond, Walter Lang:
Shelf Life Prediction by Intelligent RFID - Technical Limits of Model Accuracy. LDIC 2007: 231-238

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