"An approach to design-for-testability automation of analogue integrated ..."

Sergey Mosin (2016)

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DOI: 10.1109/MECO.2016.7525742

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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Sergey Mosin:
An approach to design-for-testability automation of analogue integrated circuits using OBIST strategy. MECO 2016: 211-214

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