"Design Patterns and Change Proneness: An Examination of Five Evolving Systems."

James M. Bieman et al. (2003)

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DOI: 10.1109/METRIC.2003.1232454

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-25

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  - https://dblp.org/rec/conf/metrics/BiemanSWMA03
James M. Bieman, Greg Straw, Huxia Wang, P. Willard Munger, Roger T. Alexander:
Design Patterns and Change Proneness: An Examination of Five Evolving Systems. IEEE METRICS 2003: 40-49

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