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"Advanced Process Defect Monitoring Model and Prediction Improvement by ..."

Alessandro Massaro et al. (2019)

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DOI: 10.1109/METROI4.2019.8792872

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-06

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  dblp key:
  - conf/metroi/MassaroMGX19
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  - https://dblp.org/rec/conf/metroi/MassaroMGX19
Alessandro Massaro, Ivano Manfredonia, Angelo Galiano, Benny Xhahysa:
Advanced Process Defect Monitoring Model and Prediction Improvement by Artificial Neural Network in Kitchen Manufacturing Industry: a Case of Study. MetroInd4.0&IoT 2019: 64-67

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