"Defect Modeling During the SLM Process for Manufacturing Microwave Devices."

Shuai Li et al. (2023)

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DOI: 10.1109/METROXRAINE58569.2023.10405715

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-16

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Shuai Li, Xiue Bao, Giovanni Gugliandolo, Haoyun Yuan, Jinkai Li, Linxiang Shao, Minghe Du, Nicola Donato, Zlatica Marinkovic, Giovanni Crupi, Lili Fang, Liming Si, Houjun Sun:
Defect Modeling During the SLM Process for Manufacturing Microwave Devices. MetroXRAINE 2023: 412-416

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