"Use of random process-based fractal measure for characterization nodules ..."

Mausumi Acharyya, Sumit Chakravarty, Jonathan Stoeckel (2008)

Details and statistics

DOI: 10.1117/12.770670

access: closed

type: Conference or Workshop Paper

metadata version: 2018-05-13

a service of  Schloss Dagstuhl - Leibniz Center for Informatics