"AVF Stressmark: Towards an Automated Methodology for Bounding the ..."

Arun A. Nair, Lizy Kurian John, Lieven Eeckhout (2010)

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DOI: 10.1109/MICRO.2010.34

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Arun A. Nair, Lizy Kurian John, Lieven Eeckhout:
AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors. MICRO 2010: 125-136

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