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"Expectation maximization classification and Laplacian based thickness ..."
Mark Holden et al. (2007)
- Mark Holden, Rafael Moreno-Vallecillo, Anthony W. F. Harris, Lavier J. Gomes, Than-Mei Diep, Pierrick T. Bourgeat, Sébastien Ourselin:
Expectation maximization classification and Laplacian based thickness measurement for cerebral cortex thickness estimation. Image Processing 2007: 65120M
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