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"Dimensional reduction analysis for Physical Layer device fingerprints with ..."

Trevor J. Bihl et al. (2015)

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DOI: 10.1109/MILCOM.2015.7357469

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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Trevor J. Bihl, Kenneth W. Bauer Jr., Michael A. Temple, Benjamin W. P. Ramsey:
Dimensional reduction analysis for Physical Layer device fingerprints with application to ZigBee and Z-Wave devices. MILCOM 2015: 360-365

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