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"BTI and HCI degradation detection in SRAM cells."

Yiorgos Sfikas, Yiorgos Tsiatouhas (2017)

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DOI: 10.1109/MOCAST.2017.7937664

access: closed

type: Conference or Workshop Paper

metadata version: 2018-10-16

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  dblp key:
  - conf/mocast/SfikasT17
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  - https://dblp.org/rec/conf/mocast/SfikasT17
Yiorgos Sfikas, Yiorgos Tsiatouhas:
BTI and HCI degradation detection in SRAM cells. MOCAST 2017: 1-4

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