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"Fast Search Algorithms for IC Printed Mark Quality Inspection."

Ming-Ching Chang, Hsien-Yei Chen, Chiou-Shann Fuh (1998)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2020-03-12

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  - electronic edition @ u-tokyo.ac.jp (open access)
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  dblp key:
  - conf/mva/ChangCF98
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  persistent URL:
  - https://dblp.org/rec/conf/mva/ChangCF98
Ming-Ching Chang, Hsien-Yei Chen, Chiou-Shann Fuh:
Fast Search Algorithms for IC Printed Mark Quality Inspection. MVA 1998: 183-188

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