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"New testing approach using near electromagnetic field probing intending to ..."
Nabil El Belghiti Alaoui et al. (2018)
- Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard:
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW 2018: 1-8
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