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"Reliability and non-hermetic properties of Ge/Si optoelectronic devices."
Su Li et al. (2015)
- Su Li, Liangbo Wang, Tuo Shi, Pengfei Cai, Mengyuan Huang, Wang Chen, Chingyin Hong, Dong Pan:
Reliability and non-hermetic properties of Ge/Si optoelectronic devices. OFC 2015: 1-3
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