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"Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT ..."

Nabil Badereddine et al. (2005)

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DOI: 10.1007/11556930_55

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - conf/patmos/BadereddineGVPL05
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Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault:
Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives. PATMOS 2005: 540-549

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