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"Failure probability of a FinFET-based SRAM cell utilizing the most ..."

Michail Noltsis et al. (2017)

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DOI: 10.1109/PATMOS.2017.8106967

access: closed

type: Conference or Workshop Paper

metadata version: 2017-11-23

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  - conf/patmos/NoltsisMRCS17
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Michail Noltsis, Eleni Maragkoudaki, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris:
Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point. PATMOS 2017: 1-8

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