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"Characterization of the RFID deterministic path loss in manufacturing ..."

Adriano Almeida Góes, Paulo Cardieri, Michel Daoud Yacoub (2012)

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DOI: 10.1109/PIMRC.2012.6362864

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Adriano Almeida Góes, Paulo Cardieri, Michel Daoud Yacoub:
Characterization of the RFID deterministic path loss in manufacturing environments. PIMRC 2012: 647-652

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