"Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault ..."

Wei Cheng et al. (2019)

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DOI: 10.29007/FV2N

access: open

type: Conference or Workshop Paper

metadata version: 2022-03-11

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  dblp key:
  - conf/proofs/ChengCGDG19
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  - https://dblp.org/rec/conf/proofs/ChengCGDG19
Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger, Sylvain Guilley:
Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection. PROOFS 2019: 17-32

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