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"An efficient methodology to solve the K-terminal network reliability problem."

Sandeep Singh et al. (2016)

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DOI: 10.1109/RAIT.2016.7507869

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-10

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  dblp key:
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Sandeep Singh, Aman Verma, Subhashis Chatterjee, Venkata Ramana:
An efficient methodology to solve the K-terminal network reliability problem. RAIT 2016: 25-28

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