default search action
"YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in ..."
Ziqiang Liu, Kejiang Ye (2023)
- Ziqiang Liu, Kejiang Ye:
YOLO-IMF: An Improved YOLOv8 Algorithm for Surface Defect Detection in Industrial Manufacturing Field. METAVERSE 2023: 15-28
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.