"Processing and editing of faces using a measurement-based skin reflectance ..."

Bernd Bickel et al. (2006)

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DOI: 10.1145/1179849.1180059

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Bernd Bickel, Tim Weyrich, Wojciech Matusik, Hanspeter Pfister, Craig Donner, Chien Tu, Janet McAndless, Jinho Lee, Addy Ngan, Henrik Wann Jensen, Markus H. Gross:
Processing and editing of faces using a measurement-based skin reflectance model. SIGGRAPH Sketches 2006: 168

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