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"Proceedings of the 1995 ACM SIGMETRICS joint international conference on ..."

Blaine D. Gaither (1995)

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DOI: 10.1145/223587

access: closed

type: Editorship

metadata version: 2021-07-30

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  - https://dblp.org/rec/conf/sigmetrics/1995
Blaine D. Gaither:
Proceedings of the 1995 ACM SIGMETRICS joint international conference on Measurement and modeling of computer systems, Ottawa, Canada, May 15-19, 1995. ACM 1995, ISBN 0-89791-695-6 [contents]

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