"Proceedings of the 2000 ACM SIGMETRICS international conference on ..."

Alexandre Brandwajn, Jim Kurose, Philippe Nain (2000)

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DOI: 10.1145/339331

access: closed

type: Editorship

metadata version: 2021-07-30

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Alexandre Brandwajn, Jim Kurose, Philippe Nain:
Proceedings of the 2000 ACM SIGMETRICS international conference on Measurement and modeling of computer systems, Santa Clara, CA, USA, June 18-21, 2000. ACM 2000, ISBN 1-58113-194-1 [contents]

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