"Proceedings of the International Conference on Measurements and Modeling ..."

Edward G. Coffman Jr., Zhen Liu, Arif Merchant (2004)

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DOI: 10.1145/1005686

access: closed

type: Editorship

metadata version: 2021-07-30

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Edward G. Coffman Jr., Zhen Liu, Arif Merchant:
Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2004, June 10-14, 2004, New York, NY, USA. ACM 2004, ISBN 1-58113-873-3 [contents]

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