"Exploiting manufacturing variations for compensating environment-induced ..."

Thomas Schmid et al. (2008)

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DOI: 10.1145/1375457.1375469

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-30

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  - https://dblp.org/rec/conf/sigmetrics/SchmidCFCS08
Thomas Schmid, Zainul Charbiwala, Jonathan Friedman, Young H. Cho, Mani B. Srivastava:
Exploiting manufacturing variations for compensating environment-induced clock drift in time synchronization. SIGMETRICS 2008: 97-108

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