"Online defect detection in layered manufacturing using process signature."

Tong Fang et al. (1998)

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DOI: 10.1109/ICSMC.1998.727536

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-07

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Tong Fang, Mohsen A. Jafari, Izzat Bakhadyrov, Ahmad Safari, Stephen C. Danforth, Noshir A. Langrana:
Online defect detection in layered manufacturing using process signature. SMC 1998: 4373-4378

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