"Noise Analysis of CMOS Ring Oscillator-based Capacitance Measurement for ..."

Javed S. Gaggatur (2022)

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DOI: 10.1109/SOCC56010.2022.9908136

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type: Conference or Workshop Paper

metadata version: 2022-10-20

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Javed S. Gaggatur:
Noise Analysis of CMOS Ring Oscillator-based Capacitance Measurement for Lab-on-Chip Application. SOCC 2022: 1-6

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