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"In-depth Analysis of the Effects of Electromagnetic Fault Injection Attack ..."

Jinteng Jiao et al. (2022)

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DOI: 10.1109/SOCC56010.2022.9908097

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-06

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  dblp key:
  - conf/socc/JiaoLFQL22
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Jinteng Jiao, He Li, Yanzhao Feng, Chengdong Qian, Qiang Liu:
In-depth Analysis of the Effects of Electromagnetic Fault Injection Attack on a 32-bit MCU. SOCC 2022: 1-6

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