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"Resistive Loss and Trans-Impedance Characterization of Nonlinear ..."

Jinsook Kim, Weiping Ni, Edwin C. Kan (2005)

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DOI: 10.1109/SOCC.2005.1554495

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Jinsook Kim, Weiping Ni, Edwin C. Kan:
Resistive Loss and Trans-Impedance Characterization of Nonlinear Transmission Lines on CMOS SOI Substrate. SoCC 2005: 203-206

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