"Oversampling Based on Data Augmentation in Convolutional Neural Network ..."

Uzma Batool et al. (2020)

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DOI: 10.3233/FAIA200547

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-01

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  - conf/somet/BatoolSIFS20
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  - https://dblp.org/rec/conf/somet/BatoolSIFS20
Uzma Batool, Mohd Ibrahim Shapiai, Nordinah Ismail, Hilman Fauzi, Syahrizal Salleh:
Oversampling Based on Data Augmentation in Convolutional Neural Network for Silicon Wafer Defect Classification. SoMeT 2020: 3-12

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