"Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion."

Tianyong Wu, Jun Yan, Jian Zhang (2014)

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DOI: 10.1109/SERE.2014.25

access: closed

type: Conference or Workshop Paper

metadata version: 2018-07-11

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Tianyong Wu, Jun Yan, Jian Zhang:
Automatic Test Data Generation for Unit Testing to Achieve MC/DC Criterion. SERE 2014: 118-126

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