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"Evaluating the Future Device Security Risk Indicator for Hundreds of IoT ..."

Pascal Oser et al. (2022)

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DOI: 10.1007/978-3-031-29504-1_3

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-17

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  dblp key:
  - conf/stm/OserELK22
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Pascal Oser, Felix Engelmann, Stefan Lüders, Frank Kargl:
Evaluating the Future Device Security Risk Indicator for Hundreds of IoT Devices. STM 2022: 52-70

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