"Anomaly Detection in Embedded Devices Through Hardware Introspection."

David Llanio Reyes, Alexander Perez-Pons, Rogelio Bofill Dean (2023)

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DOI: 10.1109/SVCC56964.2023.10165049

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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David Llanio Reyes, Alexander Perez-Pons, Rogelio Bofill Dean:
Anomaly Detection in Embedded Devices Through Hardware Introspection. SVCC 2023: 1-7

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