"A Baseline Accuracy Classification Method to Over-come the Over-Fitting ..."

Salahuddin Shaikh, Changan Liu, Maaz Rasheed Malik (2020)

> Home

Details and statistics

DOI: 10.1109/SYSCON47679.2020.9275863

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/syscon/ShaikhLM20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/syscon/ShaikhLM20
Salahuddin Shaikh, Changan Liu, Maaz Rasheed Malik:
A Baseline Accuracy Classification Method to Over-come the Over-Fitting Problem for Class- Imbalanced Defect-Prone Datasets Model. SysCon 2020: 1-7

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.