"Stress Testing for Resilience of Semiconductor Supply Chains."

Zachary A. Collier et al. (2023)

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DOI: 10.1109/UEMCON59035.2023.10315988

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-24

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Zachary A. Collier, Davis C. Loose, Elvie Sellers, Thomas L. Polmateer, Madhur Behl, Igor Linkov, James H. Lambert:
Stress Testing for Resilience of Semiconductor Supply Chains. UEMCON 2023: 42-49

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