"Investigation of TCADs Models for Characterization of Sub 16 nm In _0.53 ..."

Jay Pathak, Anand D. Darji (2017)

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DOI: 10.1007/978-981-10-7470-7_28

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Jay Pathak, Anand D. Darji:
Investigation of TCADs Models for Characterization of Sub 16 nm In _0.53 Ga _0.47 As FinFET. VDAT 2017: 279-286

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