"2013 International Symposium on VLSI Design, Automation, and Test, ..."

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type: Editorship

metadata version: 2019-10-16

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2013 International Symposium on VLSI Design, Automation, and Test, VLSI-DAT 2013, Hsinchu, Taiwan, April 22-24, 2013. IEEE 2013, ISBN 978-1-4673-4435-7 [contents]

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