"Parallel order ATPG for test compaction."

Yu-Wei Chen et al. (2018)

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DOI: 10.1109/VLSI-DAT.2018.8373264

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-13

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Yu-Wei Chen, Yu-Hao Ho, Chih-Ming Chang, Kai-Chieh Yang, Ming-Ting Li, James Chien-Mo Li:
Parallel order ATPG for test compaction. VLSI-DAT 2018: 1-4

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