"A Variation-Tolerant Bitline Leakage Sensing Scheme for Near-Threshold SRAMs."

Lih-Yih Chiou et al. (2019)

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DOI: 10.1109/VLSI-DAT.2019.8741606

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-27

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Lih-Yih Chiou, Chi-Ray Huang, Chang-Chieh Cheng, Jing-Yu Huang, Wei-Suo Ling:
A Variation-Tolerant Bitline Leakage Sensing Scheme for Near-Threshold SRAMs. VLSI-DAT 2019: 1-4

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