"Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs."

Cosette Y. H. Lin et al. (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533854

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Cosette Y. H. Lin, Ryan H.-M. Huang, Charles H.-P. Wen, Austin C.-C. Chang:
Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs. VLSI-DAT 2013: 1-4

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