"Efficient test and repair architectures for 3D TSV-based random access ..."

Shyue-Kung Lu et al. (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533889

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Shyue-Kung Lu, Uang-Chang Lu, Seng-Wen Pong, Hao-Cheng Cheng:
Efficient test and repair architectures for 3D TSV-based random access memories. VLSI-DAT 2013: 1-4

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