"CMOS reliability: From discrete device degradation to circuit aging."

Tanya Nigam (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533830

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type: Conference or Workshop Paper

metadata version: 2017-05-26

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Tanya Nigam:
CMOS reliability: From discrete device degradation to circuit aging. VLSI-DAT 2013: 1

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