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"A Novel Test Generation Method for Small-Delay Defects with User-Defined ..."
Chao-Jun Shang et al. (2019)
- Chao-Jun Shang, Cheng-Hung Wu, Kuen-Jong Lee, Yu-Hsiang Chen:
A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model. VLSI-DAT 2019: 1-4
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