"ATPG and Test Compression for Probabilistic Circuits."

Kai-Chieh Yang et al. (2019)

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DOI: 10.1109/VLSI-DAT.2019.8741869

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-27

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Kai-Chieh Yang, Ming-Ting Lee, Chen-Hung Wu, James Chien-Mo Li:
ATPG and Test Compression for Probabilistic Circuits. VLSI-DAT 2019: 1-4

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