"A hybrid built-in self-test scheme for DRAMs."

Chi-Chun Yang et al. (2015)

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DOI: 10.1109/VLSI-DAT.2015.7114502

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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Chi-Chun Yang, Jin-Fu Li, Yun-Chao Yu, Kuan-Te Wu, Chih-Yen Lo, Chao-Hsun Chen, Jenn-Shiang Lai, Ding-Ming Kwai, Yung-Fa Chou:
A hybrid built-in self-test scheme for DRAMs. VLSI-DAT 2015: 1-4

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