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"Electromigration Analysis of VLSI Circuits Using the Finite Element Method."

Matthias Thiele, Steve Bigalke, Jens Lienig (2017)

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DOI: 10.1007/978-3-030-15663-3_7

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-17

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  dblp key:
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  - https://dblp.org/rec/conf/vlsi/ThieleBL17a
Matthias Thiele, Steve Bigalke, Jens Lienig:
Electromigration Analysis of VLSI Circuits Using the Finite Element Method. VLSI-SoC (Selected Papers) 2017: 133-152

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