"Self-test method and recovery mechanism for high frequency TSV array."

Jia Zhang et al. (2011)

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DOI: 10.1109/VLSISOC.2011.6081648

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Jia Zhang, Le Yu, Haigang Yang, Y. L. Xie, F. B. Zhou, Wei Wang:
Self-test method and recovery mechanism for high frequency TSV array. VLSI-SoC 2011: 260-265

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