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"A 7nm Fin-FET 4.04-Mb/mm2 TCAM with Improved Electromigration Reliability ..."
Makoto Yabuuchi et al. (2020)
- Makoto Yabuuchi, Masao Morimoto, Yasumasa Tsukamoto, Shinji Tanaka:
A 7nm Fin-FET 4.04-Mb/mm2 TCAM with Improved Electromigration Reliability Using Far-Side Driving Scheme and Self-Adjust Reference Match-Line Amplifier. VLSI Circuits 2020: 1-2
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