"Multi-CoDec Configurations for Low Power and High Quality Scan Test."

Arvind Jain et al. (2011)

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DOI: 10.1109/VLSID.2011.15

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Arvind Jain, Sundarrajan Subramanian, Rubin A. Parekhji, Srivaths Ravi:
Multi-CoDec Configurations for Low Power and High Quality Scan Test. VLSI Design 2011: 370-375

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