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"A Reduced Complexity Algorithm for Minimizing N-Detect Tests."

Kalyana R. Kantipudi, Vishwani D. Agrawal (2007)

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DOI: 10.1109/VLSID.2007.24

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/KantipudiA07
Kalyana R. Kantipudi, Vishwani D. Agrawal:
A Reduced Complexity Algorithm for Minimizing N-Detect Tests. VLSI Design 2007: 492-497

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