"Combinational Test Generation for Acyclic SequentialCircuits using a ..."

Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agrawal (2001)

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DOI: 10.1109/ICVD.2001.902653

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Yong Chang Kim, Kewal K. Saluja, Vishwani D. Agrawal:
Combinational Test Generation for Acyclic SequentialCircuits using a Balanced ATPG Model. VLSI Design 2001: 143-148

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